TTTC: ATS Call for Participation - Advance Registration Deadline October 21!

CALL FOR PARTICIPATION

Scope -- Key Dates -- Workshop Registration -- More Information -- Committees

Scope

The 20th Anniversary of Asian Test Symposium (ATS), the premier Asian conference dedicated to Testing and Design for Testability of semiconductors, and electronic systems will be held in New Delhi, India during November 20-23. This is the first time ATS will be held in New Delhi. The conference along with its sister workshop WRTLT to be held in Jaipur, offers both stimulating programs and attractive venues. Some program highlights below.

ATS 2011 Keynote Speakers

Prof. Giovanni DeMicheli, EPFL
Dr. Janusz Rajski, Mentor Graphics
Dr. Sanjiv Taneja, Cadence

ATS 2011 Distinguished Lecturers

Dr. Rubin Parekhji, Texas Instruments
Prof. Gordon Roberts, McGill University

Tutorials

Two full day tutorials on “Delay Test for High-Performance Designs” and “Scan Compression Techniques: Theory and Practice”

Technical Paper Sessions

Testing Clock and Timing
Post-silicon debug and validation
Power-aware testing
DFT and Test Compression
Fault Diagnosis
Test Quality Improvement
Defect based testing
Processor and Memory test
Mixed-signal/RF testing
Test Automation
Board-level/System-level test

Hot Topic Presentations and Embedded Tutorial

3D IC Design and Test
Memory BIST advances for nanoscale technlogies
Memory technologies & test trends
Variation tolerance
High-level verification
Robust system design
Power-aware test
Post-silicon debug and validation
Testability of Cryptographic Hardware and Detection of Hardware Trojan

Key Dates

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Advance Registration Deadline: October 21, 2011

Workshop Registration

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More information about the conference program is available at the conference website http://www.ecs.umass.edu/ece/ats11. Visa, travel and registration information are available already at the website - Please note that the deadline for advance registration is October 21. Take advantage of the discounted registration fee by registering before that date.

More Information

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General Chair
Abhijit Chatterjee, Georgia Tech and Amit Patra, IIT Kharagpur
chat@ece.gatech.edu

Program Chair
Sandip Kundu, UMass Amherst and Srivaths Ravi, Texas Instruments
kundu@ecs.umass.edu

Committees

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Organizing Committee

General Chairs
Abhijit Chatterjee, Georgia Tech
Amit Patra, IIT Kharagpur

Program Chairs
Sandip Kundu, UMass Amherst
Srivaths Ravi, Texas Instruments, India

Finance Chairs
Virendra Singh
Gulshan Dua, Freescale Semiconductor

Local Organization Chairs
Jaswinder Ahuja, Cadence India
Pankaj Jalote, IIIT Delhi

Publications Chair
S. Sur-Kolay, ISI, Kolkata

AV Chair
Ashok Kumar Sihag, Gautam Buddha University,

European Liason
M. Renovell

US Liason
V. Agrawal, Auburn University

Publicity Chair & Web Manager
Aswin Sreedhar, Intel, US

Program Committee

Jacob Abraham, University of Texas, Austin USA
Vishwani Agarwal, Auburn University USA
Karim Arabi, Qualcomm USA
Kedarnath Balakrishnan, AMD
Bhargab B. Bhattacharya, Indian Statistical Institute India
Swarup Bhunia, Case Western Reserve University USA
Kirshnendu Chakrabarty, Duke University USA
Krishna Chakravadhanula, Cadence Design Systems
Sreejit Chakravarty, LSI Logic USA
Chia-Tso Chao, National Chiao Tung University Taiwan
Santanu Chattopadhyay, Indian Institute of Technology, Kharagpur India
Dipanwita Roy Chowdhury, Indian Institute of Technology, Kharagpur India
Vivek Chickermane, Cadence Design Systems USA
CP Ravikumar, Texas Instruments India
Varadarajan Devanathan, Texas Instruments India
Hideo Fujiwara, Nara Institute of Science and Technology (NAIST) Japan
Rajesh Galivanche, Intel USA
Patrick Girard, LIRMM/CNRS France
Elena Gramatova, Slovak Academy of Sciences Slovakia
Sandeep Gupta, University of Southern California USA
Kazumi Hatayama, Nara Institute of Science and Technology, Japan
Shi-Yu Hang, National Tsing Hua University
Masaki Hashizume, University of Tokushima Japan
Michiko Inoue, Nara Institute of Science and Technology (NAIST) Japan
Tomoo Inoue, Hiroshima City University, Japan
Seiji Kajihara, Kyushu Institute of Technology, Japan
Rohit Kapur, Synopsys USA
Erik Larsson, Linkoping University Sweden
Kuen-Jong Lee, National Cheng Kung University, Taiwan
Huawei Li, Institute of Computing Technology, CAS China
Xiaowei Li, Institute of Computing Technology, CAS China
Erik Jan Marinissen, IMEC Belgium
Cecilia Metra, University of Bolgna, Italy
Subashish Mitra, Stanford University, USA
Nilanjan Mukerjee, Mentor Graphics USA
Fidel Muradali, National Semiconductors, USA
Sule Ozev, Arizona State University, USA
Rubin Parekhji, Texas Instruments India
Srinivas Patil, Intel USA
Ilia Polian, University of Passau Germany
Hafizur Rahaman, Bengal Engineering and Science University India
Sudhakar M. Reddy, University of Iowa USA
Kewal K. Saluja, University of Wisconsin-Madison USA
Yasuo Sato, Kyushu Institute of Technology Japan
Indranil Sengupta, Indian Institute of Technology, Kharagpur India
Adit Singh, Auburn University USA
Virendra Singh, India Institute of Science India
Mani Soma, University of Washington, USA
Chau-Chin Su, National Central University, Taiwan
Nagesh Tamarapalli, AMD India
Mohammad Tehranipoor, University of Connecticut USA
Nur Touba, University of Texas, Austin USA
Kamakoti V, Indian Institute of Technology, Chennai India
Li-C. Wang, University of California, Santa Barbara USA
Xiaoqing Wen, Kyushu Institute of Technology Japan
Dong Xiang, Tsinghua University, China
Shiyi Xu, Shanghai University, China
Said Hamdioui, Delft University of Technology, Netherlands

Steering Committee

Chair
Xiaowei Li, Chinese Academy of Sciences, China

Vice Chairs
Masaki Hashizume, University of Tokushima, Japan
Kuen-Jong Lee, National Cheng Kung University, Taiwan

Members
Bhargab Bhattacharya, Indian Statistical Institute, India
Krishnendu Chakrabarty, Duke University, US
Serge Demidenko, Monash University, New Zealand
Hideo Fujiwara, Nara Institute of Science and Technology, Japan
Patrick Girard, LIRMM, France
Shi-Yu Huang, National Tsing-Hua University, Taiwan
Tomoo Inoue, Hiroshima City University, Japan
Seiji Kajihara, Kyushu Institute of Technology, Japan
Chau-Chin Su, National Chiao Tung University, Taiwan
Virendra Singh, Indian Institute of Science, India
Hiroshi Takahashi, Ehime University, Japan
Shiyi Xu, Shanghai University, China
Dafang Zhang, Hunan University, China

Past Chair (2007-2008, 2009-2010)
Seiji Kajihara, Kyushu Institute of Technology, Japan

Past Chair (2005-2006)
Cheng-Wen Wu, National Tsing Hua University, Taiwan

Past Chair (2001-2002, 2003-2004)
Hideo Fujiwara, Nara Institute of Science and Technology, Japan

For more information, visit us on the web at: http://www.ecs.umass.edu/ece/ats11

The 20th Asian Test Symposium 2011 (ATS 2011) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).